Cambridge Display Technology offers three highly advanced, flexible and user-friendly Eclipse systems for lifetime testing of a broad range of light emitting devices:

• DDU - IVL
• DDU - Lifetime
• DDU - IVL and Lifetime

Each system consists of a set of source-measure channels and corresponding fixtures for the testing of many devices in parallel. All test channels are linked to a PC which records, manages and presents the data.

The advanced Digital Drive Unit (DDU) system is fully automated and controlled by PC. In addition to Continuous Mode operation (DC drive) it offers rectangular pulsed drive (AC drive), and can also operate in Constant Light mode. These solutions significantly increase the productivity of your experimental programmes.

Part of a typical Eclipse system in 19" racking

A typical Eclipse system includes the following:

Software for measurement of IVL (current / voltage / luminance), lifetime or both
19" rack for drive units
One or more drive units, each drive unit containing eight independent drive channels
Communication cables connecting PC to each drive unit (daisy chain)
One test fixture for each drive channel
Cables from each drive channel to a test box
Documentation
Spare parts for drive units, spare communication card.

The versatile software is a particular strength of the system, offering an easy to use interface, a large range of different options for data collection, data exchange and data comparison.

Specially developed to meet the needs of researchers, device engineers and test engineers, the simplicity and ease of use of the software can facilitate and accelerate device testing and shorten development programmes.

Sample screen shot

Click to enlarge (warning - large file)

Some important features of the software include:

• Real-time data collection every two seconds
• Data collection from different devices in a single experiment (temperature, initial luminance, On-Off data collection per device)
• Real-time graphical representation of lifetime data
• Parallel data collection for multiple experiments
• Ability to sort and view experiments as a function of different parameters (material, process, lifetime conditions etc)
• Data viewing and sharing across networks or via email
• Real-time predictive half-life extrapolation algorithms

The unique Eclipse software is fully supported and updated regularly to reflect the growing needs of our customers.